Objective LD Epiplan 20x/0.40
Objective LD Epiplan 20x/0.40
Item no.: 442840-9901-000(no longer available)
Objective LD Epiplan 20x/0.40 (D=0mm with or D=1.5mm without coverglass cap) (WD=7.2mm at D=0mm)
Full DescriptionObjective with removable, 1.5 mm cover slip cap. Without cover slip cap, the objective is suitable for the use of heating chambers or similar devices with an opening thickness of 1.5 mm. Without cover slip cap the working distance is 9.1 mm.
To remove the cover glass cap please unscrew the green colour ring of the objective which can then be screwed on again without the cover glass cap.
| Magnification | 20x |
| Numerical Aperture | 0.4 |
| Free Working Distance [mm] | 7.3 |
| Coverglass Thickness [mm] | 0 |
| Thread Type | W0.8x1/36" |
| Immersion | Without Immersion |
| Field of View [mm] | 20 |
| Parfocal Length [mm] | 45.00 |
| Long Distance | 
|
| Correction Ring | |
| Iris | |
| Optical System | Infinity Color Corrected System (ICS) |
| Color Correction | achromatic |
| Biomedical Applications | |
|---|---|
| Fluorescence |
|
| - Multichannel | |
| - Ultraviolet Transmission | |
| - Infra Red Transmission | |
| BrightField |
|
| DIC [Differential Interference Contrast] | |
| High Contrast DIC | |
| PlasDIC | |
| Phase Contrast | |
| VAREL Contrast | |
| Hoffman Modulation Contrast | |
| Polarization Contrast | |
| Materials (Reflected Light) Applications | |
| BrightField |
|
| BrightField/DarkField | |
| Reflected Light DIC | |
| High Contrast DIC | |
| DIC with circular polarized light | |
| Total Interference Contrast |
|
| Polarization Contrast | |
| Options | |
| Definite Focus.2 | |
| Confocal Microscopy |
|
| - Ultra Violet | |
| - VIS (visible light) | |
| - NLO-IR / 2 Photon | |
| Total Internal Reflection Fluorescence | |
| Apotome | |
| Microdissection | |
-
Adapter M 27x0.75 / W 0.8 H "0"
Item no.: 000000-1095-168 -
DIC slider LD PN 20x/0.40 II
Item no.: 426954-0000-000
Note:
All measures in [mm]
mech. Arbeitsabstand = mechanical working distance
Deckglas = cover glass
Objektebene = object plane
Objektfeld = object field
Ausleuchtung = illumination
Probenzugänglichkeit = specimen accessibility
Note:
Please note that due to production tolerances, the given values are typical only and not guaranteed.
